"Two-Dimensional Principal Component Analysis-Based Convolutional ..."

Jianbo Yu, Jiatong Liu (2021)

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DOI: 10.1109/TIE.2020.3013492

access: closed

type: Journal Article

metadata version: 2021-07-13

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Jianbo Yu, Jiatong Liu:
Two-Dimensional Principal Component Analysis-Based Convolutional Autoencoder for Wafer Map Defect Detection. IEEE Trans. Ind. Electron. 68(9): 8789-8797 (2021)

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