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"A New Complete Condition Monitoring Method for SiC Power MOSFETs."

Enes Ugur et al. (2021)

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DOI: 10.1109/TIE.2020.2970668

access: closed

type: Journal Article

metadata version: 2020-12-17

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  - https://dblp.org/rec/journals/tie/UgurXYPA21
Enes Ugur, Chi Xu, Fei Yang, Shi Pu, Bilal Akin:
A New Complete Condition Monitoring Method for SiC Power MOSFETs. IEEE Trans. Ind. Electron. 68(2): 1654-1664 (2021)

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