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"Actual Reasons Involving Turn-Off Losses Improvement With Increasing Load ..."

Santi Agatino Rizzo, Nunzio Salerno (2024)

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DOI: 10.1109/TIE.2023.3243272

access: open

type: Journal Article

metadata version: 2023-08-05

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Santi Agatino Rizzo, Nunzio Salerno:
Actual Reasons Involving Turn-Off Losses Improvement With Increasing Load and Gate Resistance in MOSFETs Enhanced With Kelvin Source. IEEE Trans. Ind. Electron. 71(1): 369-379 (2024)

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