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"A Tradeoff Approach for Optimal Event-Triggered Fault Detection."

Aibing Qiu, Ahmad W. Al-Dabbagh, Tongwen Chen (2019)

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DOI: 10.1109/TIE.2018.2840510

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tie/QiuAC19
Aibing Qiu, Ahmad W. Al-Dabbagh, Tongwen Chen:
A Tradeoff Approach for Optimal Event-Triggered Fault Detection. IEEE Trans. Ind. Electron. 66(3): 2111-2121 (2019)

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