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"A Practical Inductor Loss Testing Scheme and Device With High Frequency ..."

Baiyi Liu et al. (2021)

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DOI: 10.1109/TIE.2020.2984985

access: closed

type: Journal Article

metadata version: 2023-02-07

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Baiyi Liu, Wei Chen, Jinghui Wang, Qingbin Chen:
A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations. IEEE Trans. Ind. Electron. 68(5): 4457-4467 (2021)

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