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"An Electromechanical Model and Simulation for Test Process of the Wafer Probe."
Junhui Li et al. (2017)
- Junhui Li
, Hailong Liao, Dasong Ge, Can Zhou
, Chengdi Xiao
, Qing Tian, Wenhui Zhu:
An Electromechanical Model and Simulation for Test Process of the Wafer Probe. IEEE Trans. Ind. Electron. 64(2): 1284-1291 (2017)
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