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"Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under ..."

Jianlong Kang et al. (2023)

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DOI: 10.1109/TIE.2022.3189071

access: closed

type: Journal Article

metadata version: 2024-05-21

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  - https://dblp.org/rec/journals/tie/KangLLCZX23
Jianlong Kang, Qing Liu, Haoze Luo, Hu Cao, Zi-Hui Zhang, Zhen Xin:
Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition. IEEE Trans. Ind. Electron. 70(5): 5224-5234 (2023)

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