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"Kernel-Ridge Regression-Based Quality Measure and Enhancement of ..."

Vinit Jakhetiya et al. (2021)

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DOI: 10.1109/TIE.2020.2965469

access: closed

type: Journal Article

metadata version: 2020-12-17

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  - https://dblp.org/rec/journals/tie/JakhetiyaGJSX21
Vinit Jakhetiya, Ke Gu, Sunil Prasad Jaiswal, Trisha Singhal, Zhifang Xia:
Kernel-Ridge Regression-Based Quality Measure and Enhancement of Three-Dimensional-Synthesized Images. IEEE Trans. Ind. Electron. 68(1): 423-433 (2021)

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