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"Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis."

Wenliao Du, Myeongsu Kang, Michael G. Pecht (2020)

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DOI: 10.1109/TIE.2019.2892667

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tie/DuKP20
Wenliao Du, Myeongsu Kang, Michael G. Pecht:
Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis. IEEE Trans. Ind. Electron. 67(3): 2272-2282 (2020)

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