![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
"Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis ..."
Nikolaos Dimitriou et al. (2020)
- Nikolaos Dimitriou
, Lampros Leontaris
, Thanasis Vafeiadis
, Dimosthenis Ioannidis
, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras
:
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. IEEE Trans. Ind. Electron. 67(7): 5748-5757 (2020)
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.