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"A Novel Fault Ride-Through Topology With High Efficiency and Fast Fault ..."

Xiaoguang Diao et al. (2023)

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DOI: 10.1109/TIE.2022.3156040

access: closed

type: Journal Article

metadata version: 2022-10-18

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  dblp key:
  - journals/tie/DiaoLSXZZ23
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  persistent URL:
  - https://dblp.org/rec/journals/tie/DiaoLSXZZ23
Xiaoguang Diao, Fei Liu, Yuan Song, Mengyue Xu, Yizhan Zhuang, Xiaoming Zha:
A Novel Fault Ride-Through Topology With High Efficiency and Fast Fault Clearing Capability for MVdc PV System. IEEE Trans. Ind. Electron. 70(2): 1501-1511 (2023)

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