Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Probabilistic Fault Detection Approach: Application to Bearing Fault ..."

Bin Zhang et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TIE.2010.2058072

access: closed

type: Journal Article

metadata version: 2020-05-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/0008SBPOV11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/0008SBPOV11
Bin Zhang, Chris Sconyers, Carl S. Byington, Romano Patrick, Marcos E. Orchard, George J. Vachtsevanos:
A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection. IEEE Trans. Ind. Electron. 58(5): 2011-2018 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.