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"A Dynamic-Key Based Secure Scan Architecture for Manufacturing and ..."

Kuen-Jong Lee, Ching-An Liu, Chia-Chi Wu (2022)

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DOI: 10.1109/TETC.2020.3021820

access: closed

type: Journal Article

metadata version: 2022-04-01

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Kuen-Jong Lee, Ching-An Liu, Chia-Chi Wu:
A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing. IEEE Trans. Emerg. Top. Comput. 10(1): 373-385 (2022)

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