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"Patent Value Analysis Using Deep Learning Models - The Case of IoT ..."

Amy J. C. Trappey et al. (2021)

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DOI: 10.1109/TEM.2019.2957842

access: closed

type: Journal Article

metadata version: 2021-09-16

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Amy J. C. Trappey, Charles V. Trappey, Usharani Hareesh Govindarajan, John J. H. Sun:
Patent Value Analysis Using Deep Learning Models - The Case of IoT Technology Mining for the Manufacturing Industry. IEEE Trans. Engineering Management 68(5): 1334-1346 (2021)

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