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"A Novel Method for Visually Mapping Intellectual Property Risks and ..."

Alexander Moerchel et al. (2024)

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DOI: 10.1109/TEM.2022.3184254

access: closed

type: Journal Article

metadata version: 2024-01-26

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Alexander Moerchel, Frank Tietze, Leonidas Aristodemou, Pratheeba Vimalnath:
A Novel Method for Visually Mapping Intellectual Property Risks and Uncertainties in Evolving Innovation Ecosystems: A Design Science Research Approach for the COVID-19 Pandemic. IEEE Trans. Engineering Management 71: 2462-2474 (2024)

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