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"Two-Way Random-Effects Analyses and Gauge R&R Studies."

Stephen B. Vardeman, Enid S. VanValkenburg (1999)

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DOI: 10.1080/00401706.1999.10485669

access: closed

type: Journal Article

metadata version: 2017-05-27

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  - journals/technometrics/VardemanV99
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  - https://dblp.org/rec/journals/technometrics/VardemanV99
Stephen B. Vardeman, Enid S. VanValkenburg:
Two-Way Random-Effects Analyses and Gauge R&R Studies. Technometrics 41(3): 202-211 (1999)

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