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"A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process."

Panagiotis Tsiamyrtzis, Douglas M. Hawkins (2005)

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DOI: 10.1198/004017005000000346

access: closed

type: Journal Article

metadata version: 2021-10-14

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  dblp key:
  - journals/technometrics/TsiamyrtzisH05
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  - https://dblp.org/rec/journals/technometrics/TsiamyrtzisH05
Panagiotis Tsiamyrtzis, Douglas M. Hawkins:
A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process. Technometrics 47(4): 446-456 (2005)

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