"Blind Identification of Manufacturing Variation Patterns by Combining ..."

Xuemei Shan, Daniel W. Apley (2008)

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DOI: 10.1198/004017008000000316

access: closed

type: Journal Article

metadata version: 2017-05-27

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Xuemei Shan, Daniel W. Apley:
Blind Identification of Manufacturing Variation Patterns by Combining Source Separation Criteria. Technometrics 50(3): 332-343 (2008)

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