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"A Hierarchical Model for Heterogenous Reliability Field Data."

Eric Mittman, Colin Lewis-Beck, William Q. Meeker (2019)

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DOI: 10.1080/00401706.2018.1518273

access: closed

type: Journal Article

metadata version: 2019-08-05

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  - journals/technometrics/MittmanLM19
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  - https://dblp.org/rec/journals/technometrics/MittmanLM19
Eric Mittman, Colin Lewis-Beck, William Q. Meeker:
A Hierarchical Model for Heterogenous Reliability Field Data. Technometrics 61(3): 354-368 (2019)

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