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"Identifying Spatial Variation Patterns in Multivariate Manufacturing ..."

Daniel W. Apley, Ho-Young Lee (2003)

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DOI: 10.1198/004017003000000041

access: closed

type: Journal Article

metadata version: 2017-05-27

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Daniel W. Apley, Ho-Young Lee:
Identifying Spatial Variation Patterns in Multivariate Manufacturing Processes - A Blind Separation Approach. Technometrics 45(3): 220-234 (2003)

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