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"Characterization of Soft Errors Caused by Single Event Upsets in CMOS ..."

Tanay Karnik, Peter Hazucha, Jagdish Patel (2004)

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DOI: 10.1109/TDSC.2004.14

access: closed

type: Journal Article

metadata version: 2020-04-09

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  - https://dblp.org/rec/journals/tdsc/KarnikHP04
Tanay Karnik, Peter Hazucha, Jagdish Patel:
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes. IEEE Trans. Dependable Secur. Comput. 1(2): 128-143 (2004)

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