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"Analysis of PI-Control for Atomic Force Microscopy in Contact Mode."

Saverio Messineo et al. (2022)

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DOI: 10.1109/TCST.2021.3121321

access: open

type: Journal Article

metadata version: 2023-07-27

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  - https://dblp.org/rec/journals/tcst/MessineoRBG22
Saverio Messineo, Michael R. P. Ragazzon, Fabio Busnelli, Jan Tommy Gravdahl:
Analysis of PI-Control for Atomic Force Microscopy in Contact Mode. IEEE Trans. Control. Syst. Technol. 30(4): 1681-1695 (2022)

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