"TPMScan: A wide-scale study of security-relevant properties of TPM 2.0 chips."

Petr Svenda et al. (2024)

Details and statistics

DOI: 10.46586/TCHES.V2024.I2.714-734

access: open

type: Journal Article

metadata version: 2024-06-08

a service of  Schloss Dagstuhl - Leibniz Center for Informatics