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"Garbage collection policy to improve durability for flash memory."

Guangxia Xu et al. (2012)

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DOI: 10.1109/TCE.2012.6414990

access: closed

type: Journal Article

metadata version: 2020-07-09

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  - https://dblp.org/rec/journals/tce/XuLZL12
Guangxia Xu, Yanbing Liu, Xiaoqin Zhang, Mingwei Lin:
Garbage collection policy to improve durability for flash memory. IEEE Trans. Consumer Electron. 58(4): 1232-1236 (2012)

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