"Next-Generation Consumer Electronics Data Auditing Scheme Toward ..."

Yi Li et al. (2024)

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DOI: 10.1109/TCE.2024.3368206

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type: Journal Article

metadata version: 2024-08-04

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Yi Li, Jian Shen, Pandi Vijayakumar, Chin-Feng Lai, Audithan Sivaraman, Pradip Kumar Sharma:
Next-Generation Consumer Electronics Data Auditing Scheme Toward Cloud-Edge Distributed and Resilient Machine Learning. IEEE Trans. Consumer Electron. 70(1): 2244-2256 (2024)

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