"Stability Analysis of the Grid-Tied VSC Considering the Influence of Short ..."

Rui Yin et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TCSII.2021.3076058

access: closed

type: Journal Article

metadata version: 2022-01-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcasII/YinSWZ22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcasII/YinSWZ22
Rui Yin, Yuanyuan Sun, Shanshan Wang, Lu Zhang:
Stability Analysis of the Grid-Tied VSC Considering the Influence of Short Circuit Ratio and X/R. IEEE Trans. Circuits Syst. II Express Briefs 69(1): 129-133 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.