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"Holistic Device Modeling: Toward a Unified MOSFET Model Including ..."

Mustafa Berke Yelten (2022)

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DOI: 10.1109/TCSII.2022.3171136

access: closed

type: Journal Article

metadata version: 2022-06-13

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Mustafa Berke Yelten:
Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions. IEEE Trans. Circuits Syst. II Express Briefs 69(6): 2635-2640 (2022)

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