"Double-Node-Upset Self-Recoverable Latch Design for Wide Voltage Range ..."

Yuxin Bai et al. (2024)

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DOI: 10.1109/TCSII.2023.3324006

access: closed

type: Journal Article

metadata version: 2024-10-17

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Yuxin Bai, Chen Xin, Xinjie Zhou, Yanan Yin, Ying Zhang:
Double-Node-Upset Self-Recoverable Latch Design for Wide Voltage Range Application. IEEE Trans. Circuits Syst. II Express Briefs 71(3): 1411-1415 (2024)

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