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"Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann ..."

Mikail Yayla et al. (2022)

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DOI: 10.1109/TCSI.2022.3156165

access: open

type: Journal Article

metadata version: 2023-08-28

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Mikail Yayla, Simon Thomann, Sebastian Buschjäger, Katharina Morik, Jian-Jia Chen, Hussam Amrouch:
Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture. IEEE Trans. Circuits Syst. I Regul. Pap. 69(6): 2516-2528 (2022)

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