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"Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG ..."
Yarong Fu et al. (2022)
- Yarong Fu, Wang Wang
, Xin Zhong, Manni Li, Zixu Li, Qing Dong, Yu Jiang, Yinyin Lin
:
Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact. IEEE Trans. Circuits Syst. I Regul. Pap. 69(12): 5185-5194 (2022)
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