"Constraining Transition Propagation for Low-Power Scan Testing Using a ..."

Dong Xiang et al. (2007)

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DOI: 10.1109/TCSII.2007.892393

access: closed

type: Journal Article

metadata version: 2020-05-27

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Dong Xiang, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, Jiaguang Sun:
Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture. IEEE Trans. Circuits Syst. II Express Briefs 54-II(5): 450-454 (2007)

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