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"Defect Tolerance Based on Coding and Series Replication in ..."

Warren Robinett, Philip Kuekes, R. Stanley Williams (2007)

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DOI: 10.1109/TCSI.2007.907865

access: closed

type: Journal Article

metadata version: 2020-05-22

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Warren Robinett, Philip Kuekes, R. Stanley Williams:
Defect Tolerance Based on Coding and Series Replication in Transistor-Logic Demultiplexer Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(11): 2410-2421 (2007)

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