"A Design-Oriented Soft Error Rate Variation Model Accounting for Both ..."

Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry (2010)

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DOI: 10.1109/TCSI.2009.2033528

access: closed

type: Journal Article

metadata version: 2020-05-22

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Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry:
A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM Cells. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(6): 1298-1311 (2010)

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