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"Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits."

Byoungho Kim, Jacob A. Abraham (2011)

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DOI: 10.1109/TCSI.2011.2106030

access: closed

type: Journal Article

metadata version: 2020-05-22

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Byoungho Kim, Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(8): 1773-1784 (2011)

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