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"On Diagnosing the Aging Level of Automotive Semiconductor Devices."
Jihun Jung et al. (2017)
- Jihun Jung
, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs 64-II(7): 822-826 (2017)
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