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"Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process ..."

Alessandro Finocchiaro et al. (2018)

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DOI: 10.1109/TCSII.2018.2852949

access: closed

type: Journal Article

metadata version: 2020-05-27

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Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Egidio Ragonese, Giuseppe Palmisano:
Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. IEEE Trans. Circuits Syst. II Express Briefs 65-II(10): 1355-1359 (2018)

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