"Dual-Source-Line-Bias Scheme to Improve the Read Margin and Sensing ..."

Subho Chatterjee, Sayeef S. Salahuddin, Saibal Mukhopadhyay (2010)

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DOI: 10.1109/TCSII.2010.2040308

access: closed

type: Journal Article

metadata version: 2020-05-27

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Subho Chatterjee, Sayeef S. Salahuddin, Saibal Mukhopadhyay:
Dual-Source-Line-Bias Scheme to Improve the Read Margin and Sensing Accuracy of STTRAM in Sub-90-nm Nodes. IEEE Trans. Circuits Syst. II Express Briefs 57-II(3): 208-212 (2010)

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