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"All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and ..."

Keith A. Bowman et al. (2011)

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DOI: 10.1109/TCSI.2011.2163893

access: closed

type: Journal Article

metadata version: 2022-10-02

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Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Arijit Raychowdhury, Muhammad M. Khellah, Bibiche M. Geuskens, Shih-Lien Lu, Paolo A. Aseron, Tanay Karnik, Vivek K. De:
All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 2017-2025 (2011)

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