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"Efficient Process Shift Detection and Test Realignment."

Ender Yilmaz, Sule Ozev, Kenneth M. Butler (2013)

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DOI: 10.1109/TCAD.2013.2276614

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Efficient Process Shift Detection and Test Realignment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(12): 1934-1942 (2013)

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