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"An Efficient and Reliable Approach for Semiconductor Device Parameter ..."

Shui-Jinn Wang, Jau-Yien Lee, Chun-Yen Chang (1986)

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DOI: 10.1109/TCAD.1986.1270184

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/WangLC86
Shui-Jinn Wang, Jau-Yien Lee, Chun-Yen Chang:
An Efficient and Reliable Approach for Semiconductor Device Parameter Extraction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 170-179 (1986)

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