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"Probabilistic fault detection and the selection of measurements for analog ..."

Zhihua Wang, Georges G. E. Gielen, Willy M. C. Sansen (1998)

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DOI: 10.1109/43.720321

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/WangGS98
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Zhihua Wang, Georges G. E. Gielen, Willy M. C. Sansen:
Probabilistic fault detection and the selection of measurements for analog integrated circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(9): 862-872 (1998)

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