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"A new approach to the design of built-in self-testing PLAs for high fault ..."

Shambhu J. Upadhyaya, Kewal K. Saluja (1988)

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DOI: 10.1109/43.3130

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/UpadhyayaS88
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  - https://dblp.org/rec/journals/tcad/UpadhyayaS88
Shambhu J. Upadhyaya, Kewal K. Saluja:
A new approach to the design of built-in self-testing PLAs for high fault coverage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1): 60-67 (1988)

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