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"RP-SYN: synthesis of random pattern testable circuits with test point ..."

Nur A. Touba, Edward J. McCluskey (1999)

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DOI: 10.1109/43.775638

access: closed

type: Journal Article

metadata version: 2020-09-24

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Nur A. Touba, Edward J. McCluskey:
RP-SYN: synthesis of random pattern testable circuits with test point insertion. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(8): 1202-1213 (1999)

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