"Techniques and algorithms for fault grading of FPGA interconnect test ..."

Mehdi Baradaran Tahoori, Subhasish Mitra (2004)

Details and statistics

DOI: 10.1109/TCAD.2003.822112

access: closed

type: Journal Article

metadata version: 2021-07-25

a service of  Schloss Dagstuhl - Leibniz Center for Informatics