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"A Pattern Recognition Based Method for IC Failure Analysis."

Andrzej J. Strojwas, Stephen W. Director (1985)

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DOI: 10.1109/TCAD.1985.1270100

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/StrojwasD85
Andrzej J. Strojwas, Stephen W. Director:
A Pattern Recognition Based Method for IC Failure Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 4(1): 76-92 (1985)

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