"Adaptive Test With Test Escape Estimation for Mixed-Signal ICs."

Haralampos-G. D. Stratigopoulos, Christian Streitwieser (2018)

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DOI: 10.1109/TCAD.2017.2783302

access: closed

type: Journal Article

metadata version: 2020-09-24

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Haralampos-G. D. Stratigopoulos, Christian Streitwieser:
Adaptive Test With Test Escape Estimation for Mixed-Signal ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2125-2138 (2018)

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