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"Simulation of spatial fault distributions for integrated circuit yield ..."

Charles H. Stapper (1989)

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DOI: 10.1109/43.44511

access: closed

type: Journal Article

metadata version: 2020-09-24

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Charles H. Stapper:
Simulation of spatial fault distributions for integrated circuit yield estimations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(12): 1314-1318 (1989)

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