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"Path delay fault diagnosis and coverage-a metric and an estimationtechnique."

Mukund Sivaraman, Andrzej J. Strojwas (2001)

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DOI: 10.1109/43.913761

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/SivaramanS01
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  - https://dblp.org/rec/journals/tcad/SivaramanS01
Mukund Sivaraman, Andrzej J. Strojwas:
Path delay fault diagnosis and coverage-a metric and an estimationtechnique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(3): 440-457 (2001)

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