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"Analysis of Breakdown Phenomena in MOSFET's."

A. Schütz, Siegfried Selberherr, Hans W. Pötzl (1982)

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DOI: 10.1109/TCAD.1982.1269997

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/SchutzSP82
A. Schütz, Siegfried Selberherr, Hans W. Pötzl:
Analysis of Breakdown Phenomena in MOSFET's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1(2): 77-85 (1982)

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