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"Detectability of CMOS stuck-open faults using random and pseudorandom test ..."

Sarma Sastry, Melvin A. Breuer (1988)

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DOI: 10.1109/43.7792

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sarma Sastry, Melvin A. Breuer:
Detectability of CMOS stuck-open faults using random and pseudorandom test sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(9): 933-946 (1988)

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